LII2660-PF doc. no : qw0905- rev. : a date : 19 - jul.- 2007 LII2660-PF data sheet ligitek electronics co.,ltd. property of ligitek only bipolar type led lamps lead-free parts pb
25.0min 1.0min note : 1.all dimension are in millimeter tolerance is 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. 0 0 -60 100% 50% 75%25% -30 directivity radiation 2.54typ 1 2 60 100% 50% 25%75% 30 1 2 i 4.3 3.3 3.1 2.9 ligitek electronics co.,ltd. property of ligitek only 0.5 typ 1.5max package dimensions LII2660-PF part no. i 1/5 page
symbol i fp pd t opr color lens red diffused tstg note : 1.the forward voltage data did not including 0.1v testing tolerance. 2. the luminous intensity data did not including 15% testing tolerance. typical electrical & optical characteristics (ta=25 ) absolute maximum ratings at ta=25 storage temperature gaasp/gap LII2660-PF orange emitted material part no forward current i f reverse current @5v operating temperature ir peak forward current duty 1/10@10khz power dissipation parameter part no. LII2660-PF -40 ~ +100 viewing angle 2 1/2 (deg) peak wave length pnm 63545 1.72.63.05.0 max. min. typ. min. 50 spectral halfwidth nm forward voltage @20ma(v) luminous intensity @10ma(mcd) ma 30 mw ma a 10 -40 ~ +85 120 100 unit ratings i page 2/5 ligitek electronics co.,ltd. property of ligitek only gaasp/gap orange 635451.72.63.05.0
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( ) r e l a t i v e i n t e n s i t y @ 2 0 m a wavelength (nm) f o r w a r d v o l t a g e @ 2 0 m a n o r m a l i z e @ 2 5 fig.4 relative intensity vs. temperature ambient temperature( ) r e l a t i v e i n t e n s i t y @ 2 0 m a n o r m a l i z e @ 2 5 typical electro-optical characteristics curve forward voltage(v) fig.1 forward current vs. forward voltage f o r w a r d c u r r e n t ( m a ) forward current(ma) fig.2 relative intensity vs. forward current r e l a t i v e i n t e n s i t y n o r m a l i z e @ 2 0 m a ligitek electronics co.,ltd. property of ligitek only 1.0 0.1 1.0 10 100 1000 1.0101001000 0.0 0.5 1.0 1.5 2.0 2.5 3.0 -40-200204060 1.0 1.1 1.2 550 600 0.0 0.5 1.0 2.03.04.05.0 80100 0.8 0.9 -20 -40 40 20 080100 60 2.0 0.0 0.5 1.0 1.5 2.5 3.0 650 700750 e - i chip page3/5 part no. LII2660-PF
dip soldering preheat: 120 c max preheat time: 60seconds max ramp-up 2 c/sec(max) ramp-down:-5 c/sec(max) solder bath:260 c max dipping time:3 seconds max distance:2mm min(from solder joint to body) note:1.wave solder should not be made more than one time. 2.you can just only select one of the soldering conditions as above. 60 seconds max 25 0 0 time(sec) 150 2 /sec max preheat 50 100 temp( c) 120 260 260 c3sec max 5 /sec max soldering condition(pb-free) 1.iron: soldering iron:30w max temperature 350 c max soldering time:3 seconds max(one time only) distance:2mm min(from solder joint to body) 2.wave soldering profile ligitek electronics co.,ltd. property of ligitek only page 5/6 part no. LII2660-PF
the purpose of this test is the resistance of the device under tropical for hours. 1.ta=65 5 2.rh=90%~95% 3.t=240hrs 2hrs high temperature high humidity test mil-std-202:103b jis c 7021: b-11 1.ta=105 5 &-40 5 (10min) (10min) 2.total 10 cycles solderability test 1.t.sol=230 5 2.dwell time=5 1sec solder resistance test 1.t.sol=260 5 2.dwell time= 10 1sec. thermal shock test mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 this test intended to see soldering well performed or not. the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, +72hrs) 1.ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs) 1.ta=105 5 2.t=1000 hrs (-24hrs, +72hrs) low temperature storage test high temperature storage test operating life test test itemtest condition reliability test: this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. jis c 7021: b-12 the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. mil-std-883:1008 jis c 7021: b-10 description reference standard ligitek electronics co.,ltd. property of ligitek only 6/6 page part no. LII2660-PF
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